and a third device which does measuring to the thickness of the photoresistor of the wafer arranged on the sucking disc (2).
以
装置(5)，对安装在吸盘(2)上的晶片的光敏电阻的厚度进
测定。
and a third device which does measuring to the thickness of the photoresistor of the wafer arranged on the sucking disc (2).
以装置(5)，对安装在吸盘(2)上的晶片的光敏电阻的厚度进测定。
声明：以上例句、词性分类均由互联网资源自动
，
分未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
