We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
述了次条纹积分干涉计量的原理,仅用
幅光载频干涉条纹图获取全部位相信
。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
述了次条纹积分干涉计量的原理,仅用
幅光载频干涉条纹图获取全部位相信
。
The principle and structure of laser shearography and electronic speckle interferometry were introduced.Speckle pattern was disposed and analysed.
介绍了研制的激光电子剪切散斑干涉成像系统的原理及结构组成,对散斑图像进行了图像处理分析。
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