The band edge excitonic transitions were measured by the reflectivity and photoluminescence measurements.
利用射及光激萤光量测能隙边缘的激子跃迁。
The band edge excitonic transitions were measured by the reflectivity and photoluminescence measurements.
利用射及光激萤光量测能隙边缘的激子跃迁。
With convolution integral, a new formulation for describing the relation of soft X-ray reflectivity of multilayer with the different energy Monochromaticity of incident light is deduced.
利用数学卷积积分,理论推导出一个在入射光不同单色性下精确计算多层膜射率的公式。
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