How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短设计周期、降低芯
而又不损失芯性能的前提下
SOC系统芯的测试是芯设计
和测试当前所要面对的挑战。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短设计周期、降低芯而又不损失芯性能的前提下SOC系统芯的测试是芯设计和测试当前所要面对的挑战。
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审核，其表达内容亦不代表
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